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BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
Vydáno: 2023-10-20
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Vydáno: 2024-12-20
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BS EN 62047-9:2011
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
Vydáno: 2013-01-31
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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Vydáno: 2003-01-17
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Vydáno: 2019-09-02
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PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor die products EXPRESS model schema for data exchange
Vydáno: 2008-09-30
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BS IEC 60747-18-1:2019
Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Vydáno: 2019-06-07
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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Vydáno: 2006-11-30
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