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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Vydáno: 2023-08-31
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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Vydáno: 2023-03-27
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PD IEC TR 63571:2025
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Vydáno: 2025-05-16
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BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Vydáno: 2020-07-22
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BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Vydáno: 2016-05-31
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BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
Vydáno: 2018-08-30
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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Vydáno: 2003-01-20
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