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>BSI Standards>31 ELEKTRONIKA>31.200 Integrované obvody. Mikroelektronika

31.200 Integrované obvody. Mikroelektronika

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136 results
First page135678...101112Last page
BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Vydáno: 2007-11-30
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BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Vydáno: 1994-05-15
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BS CECC 90000:1991
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Vydáno: 1991-03-29
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BS CECC 90105:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
Vydáno: 1987-05-15
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BS EN 61967-6:2002+A1:2008
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method
Vydáno: 2010-12-31
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BS CECC 90104:1990
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB
Vydáno: 1994-08-15
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BS CECC 63000:1990
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
Vydáno: 1990-12-31
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BS CECC 90104:1981
Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB
Vydáno: 1981-11-15
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BS QC 760101:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
Vydáno: 1997-08-15
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Vydáno: 2013-10-31
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BS EN 62132-2:2011
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method
Vydáno: 2011-04-30
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BS EN 190116:1994
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits
Vydáno: 1994-03-15
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136 results
First page135678...101112Last page