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>BSI Standards>31 ELEKTRONIKA>31.200 Integrované obvody. Mikroelektronika

31.200 Integrované obvody. Mikroelektronika

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136 results
First page135678...101112Last page
BS EN 61967-6:2002+A1:2008
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method
Vydáno: 2010-12-31
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BS CECC 90104:1990
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB
Vydáno: 1994-08-15
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BS CECC 90000:1991
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Vydáno: 1991-03-29
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BS CECC 90115:1994
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
Vydáno: 1994-05-15
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BS EN 62132-3:2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
Vydáno: 2007-11-30
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BS EN 62215-3:2013
Integrated circuits. Measurement of impulse immunity Non-synchronous transient injection method
Vydáno: 2013-10-31
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BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist and report
Vydáno: 2002-06-18
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BS CECC 90103:1983
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS
Vydáno: 1987-06-02
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BS IEC 60748-11:2000
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Vydáno: 2011-07-31
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BS IEC 60748-2-11:1999
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
Vydáno: 1999-08-15
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PD IEC/TR 61967-4-1:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
Vydáno: 2006-01-30
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BS QC 790303:1994
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
Vydáno: 1994-02-15
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136 results
First page135678...101112Last page