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71.040.40 Chemická analýza
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Vydáno: 2005-09-11
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BS ISO 16962:2017
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
Vydáno: 2017-03-31
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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Vydáno: 2009-02-28
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BS ISO 14975:2000
Surface chemical analysis. Information formats
Surface chemical analysis. Information formats
Vydáno: 2001-05-15
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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Vydáno: 2007-08-31
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BS ISO 28600:2011
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Vydáno: 2011-07-31
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BS ISO 6145-2:2014
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Vydáno: 2014-07-31
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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Vydáno: 2005-03-31
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Vydáno: 2020-02-27
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