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71.040.40 Chemická analýza
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-03-26
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PD ISO/TR 14187:2020
Surface chemical analysis. Characterization of nanostructured materials
Surface chemical analysis. Characterization of nanostructured materials
Vydáno: 2020-07-03
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BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Vydáno: 2021-06-14
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PD ISO/TR 15969:2021 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-06-21
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BS ISO 18115-2:2021 - TC
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Vydáno: 2022-02-09
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BS EN IEC 61207-3:2019 - TC
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Vydáno: 2020-02-24
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BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Vydáno: 2023-02-15
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BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Vydáno: 2022-10-31
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