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71.040.40 Chemická analýza
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BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Vydáno: 2011-12-31
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-03-26
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BS EN 50436-7:2024 - TC
Tracked Changes. Alcohol interlocks. Test methods and performance requirements Installation document
Tracked Changes. Alcohol interlocks. Test methods and performance requirements Installation document
Vydáno: 2024-09-05
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PD ISO/TS 25138:2025
Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Vydáno: 2025-02-24
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25/30483844 DC
BS ISO 24237 Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
BS ISO 24237 Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Vydáno: 2025-01-27
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BS ISO 7431-2:2024
Thiourea for industrial use Specifications
Thiourea for industrial use Specifications
Vydáno: 2024-01-19
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BS ISO 20289:2025 - TC
Tracked Changes. Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Tracked Changes. Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
Vydáno: 2025-06-16
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BS EN ISO 6143:2025
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
Vydáno: 2025-06-25
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BS ISO 17862:2022
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Vydáno: 2022-10-31
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BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Vydáno: 2023-02-15
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