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71.040.40 Chemická analýza
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BS 6337-4:1984
General methods of chemical analysis Method for determination of chloride ions by potentiometry
General methods of chemical analysis Method for determination of chloride ions by potentiometry
Vydáno: 1984-01-31
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BS EN ISO 16664:2017
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Vydáno: 2017-08-11
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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Vydáno: 2019-05-31
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BS ISO 16242:2011
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
Vydáno: 2011-12-31
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BS EN 61207-1:2010
Expression of performance of gas analyzers General
Expression of performance of gas analyzers General
Vydáno: 2011-02-28
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Vydáno: 2010-02-28
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Vydáno: 2015-10-31
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BS EN ISO 6145-4:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Vydáno: 2009-02-28
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BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Vydáno: 2013-10-31
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