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>24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
sklademVydáno: 2024-08-16
24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

24/30499009 DC

BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

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Označení normy:24/30499009 DC
Počet stran:31
Vydáno:2024-08-16
Status:Draft for Comment
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24/30499009 DC


This standard 24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
  • 31.080.01 Semiconductor devices in general

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