BS EN 60749-25:2003

This standard BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

• 31.080.01 Semiconductor devices in general

Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.