>BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods Temperature cycling
sklademVydáno: 2003-10-30
BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
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4648 Kč
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4648 Kč
Označení normy:
BS EN 60749-25:2003
Počet stran:
16
Vydáno:
2003-10-30
ISBN:
0 580 42859 1
Status:
Standard
Popis
BS EN 60749-25:2003
This standard BS EN 60749-25:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
31.080.01 Semiconductor devices in general
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.
