BS EN 62416:2010

This standard BS EN 62416:2010 Semiconductor devices. Hot carrier test on MOS transistors is classified in these ICS categories:

• 31.080.30 Transistors

This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.