Cena s DPH / bez DPH
>BS EN IEC 60749-24:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
sklademVydáno: 2026-02-02
BS EN IEC 60749-24:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

BS EN IEC 60749-24:2026 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
Netisknutelné
6786 Kč
Anglicky Tisk
Skladem
6786 Kč
Označení normy:BS EN IEC 60749-24:2026 - TC
Počet stran:35
Vydáno:2026-02-02
ISBN:978 0 539 40889 8
Status:Tracked Changes
Popis

BS EN IEC 60749-24:2026 - TC


This standard BS EN IEC 60749-24:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general