Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDANovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>BS IEC 62047-46:2025 Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane
Sponsored link
sklademVydáno: 2025-04-30
BS IEC 62047-46:2025 Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane

BS IEC 62047-46:2025

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of tensile strength of nanoscale thickness membrane

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
4740 Kč
Anglicky Tisk
Skladem
4740 Kč
Označení normy:BS IEC 62047-46:2025
Počet stran:18
Vydáno:2025-04-30
ISBN:978 0 539 21850 3
Status:Standard
Popis

BS IEC 62047-46:2025


This standard BS IEC 62047-46:2025 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Tisk