Cena s DPH / bez DPH
Sponsored link
sklademVydáno: 2023-01-03
BS ISO 17109:2022 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
9240 Kč
Anglicky Tisk
Skladem
9240 Kč
Označení normy: | BS ISO 17109:2022 - TC |
Počet stran: | 68 |
Vydáno: | 2023-01-03 |
ISBN: | 978 0 539 24254 6 |
Status: | Tracked Changes |
Popis
BS ISO 17109:2022 - TC
This standard BS ISO 17109:2022 - TC Tracked Changes. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films is classified in these ICS categories:
- 71.040.40 Chemical analysis