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Hlavní stránka>BS ISO 17297:2025 Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary
sklademVydáno: 2025-05-29
BS ISO 17297:2025 Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary

BS ISO 17297:2025

Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary

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Anglicky Zabezpečené PDF
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6600 Kč
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6600 Kč
Označení normy:BS ISO 17297:2025
Počet stran:26
Vydáno:2025-05-29
ISBN:978 0 539 24981 1
Status:Standard
Počet stran (Anglicky):26
ISBN (Anglicky):978 0 539 24981 1
Popis

BS ISO 17297:2025


This standard BS ISO 17297:2025 Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary is classified in these ICS categories:
  • 01.040.71 Chemical technology (Vocabularies)
  • 71.040.50 Physicochemical methods of analysis