>BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density
sklademVydáno: 2024-05-07
BS ISO 5618-2:2024
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Method for determining etch pit density
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
Netisknutelné
7616 Kč
Anglicky Tisk
Skladem
7616 Kč
Označení normy:
BS ISO 5618-2:2024
Počet stran:
34
Vydáno:
2024-05-07
ISBN:
978 0 539 22479 5
Status:
Standard
Popis
BS ISO 5618-2:2024
This standard BS ISO 5618-2:2024 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects is classified in these ICS categories:
