PRICES include / exclude VAT
31.080.01 Polovodičové součástky obecně
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Vydáno: 2017-11-28
Anglicky Secure PDF
Immediate download
Non-printable
196.81 €
Anglicky Hardcopy
In stock
196.81 €
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Vydáno: 2008-06-30
Anglicky Secure PDF
Immediate download
Non-printable
196.81 €
Anglicky Hardcopy
In stock
196.81 €
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Vydáno: 2011-07-31
Anglicky Secure PDF
Immediate download
Non-printable
322.49 €
Anglicky Hardcopy
In stock
322.49 €
Anglicky Secure PDF
Immediate download
Non-printable
322.49 €
Anglicky Hardcopy
In stock
322.49 €
BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Vydáno: 1990-03-30
Anglicky Secure PDF
Immediate download
Non-printable
412.59 €
Anglicky Hardcopy
In stock
412.59 €
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Vydáno: 2017-11-24
Anglicky Secure PDF
Immediate download
Non-printable
168.36 €
Anglicky Hardcopy
In stock
168.36 €
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Vydáno: 2011-09-30
Anglicky Secure PDF
Immediate download
Non-printable
275.06 €
Anglicky Hardcopy
In stock
275.06 €
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Vydáno: 2004-06-24
Anglicky Secure PDF
Immediate download
Non-printable
168.36 €
Anglicky Hardcopy
In stock
168.36 €
BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Vydáno: 2019-06-10
Anglicky Secure PDF
Immediate download
Non-printable
275.06 €
Anglicky Hardcopy
In stock
275.06 €
Anglicky Secure PDF
Immediate download
Non-printable
23.71 €
Anglicky Hardcopy
In stock
23.71 €
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Vydáno: 2020-09-17
Anglicky Secure PDF
Immediate download
Non-printable
381.77 €
Anglicky Hardcopy
In stock
381.77 €
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Vydáno: 2003-10-24
Anglicky Secure PDF
Immediate download
Non-printable
168.36 €
Anglicky Hardcopy
In stock
168.36 €