PRICES include / exclude VAT
31.080.01 Polovodičové součástky obecně
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Vydáno: 2022-12-20
Anglicky Secure PDF
Immediate download
Non-printable
391.15 €
Anglicky Hardcopy
In stock
391.15 €
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
199.17 €
Anglicky Hardcopy
In stock
199.17 €
Anglicky Secure PDF
Immediate download
Non-printable
189.57 €
Anglicky Hardcopy
In stock
189.57 €
26/30564419 DC
BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
Vydáno: 2026-05-29
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €
Anglicky Secure PDF
Immediate download
Non-printable
43.19 €
Anglicky Hardcopy
In stock
43.19 €
BS EN IEC 60749-26:2026
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Vydáno: 2026-02-24
Anglicky Secure PDF
Immediate download
Non-printable
386.35 €
Anglicky Hardcopy
In stock
386.35 €
26/30551649 DC
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Vydáno: 2026-01-30
Anglicky Secure PDF
Immediate download
Non-printable
24.00 €
Anglicky Hardcopy
In stock
24.00 €