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>BSI Standards>31 ELEKTRONIKA>31.080 Polovodičové součástky>31.080.01 Polovodičové součástky obecně

31.080.01 Polovodičové součástky obecně

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188 results
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BS EN IEC 60749-26:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Vydáno: 2026-02-27
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26/30544424 DC
Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
Vydáno: 2026-02-11
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BS EN IEC 62007-2:2025
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Vydáno: 2025-09-23
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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Vydáno: 2020-09-09
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BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Vydáno: 2011-08-31
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BS EN 60191-6-21:2010
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Measuring methods for package dimensions of small outline packages (SOP)
Vydáno: 2010-12-31
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BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Vydáno: 2010-07-31
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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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BS EN 60191-6-3:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of quad flat packs (QFP)
Vydáno: 2001-05-15
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BS EN 60191-6-17:2011
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for stacked packages. Fine-pitch ball grid array and fine-pitch land grid array (P-PFBGA and P-PFLGA)
Vydáno: 2011-06-30
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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Vydáno: 2017-11-24
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BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Vydáno: 2011-02-28
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188 results
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