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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Vydáno: 2018-04-18
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Vydáno: 2018-04-30
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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Vydáno: 2020-10-01
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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2020-02-24
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2019-05-15
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BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Vydáno: 2020-02-24
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BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Vydáno: 2019-06-10
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458.92 €
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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Vydáno: 2018-04-30
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458.92 €
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458.92 €
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352.08 €
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