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BS EN IEC 60749-24:2026
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Vydáno: 2026-01-21
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25/30511332 DC
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Vydáno: 2025-08-26
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Vydáno: 2023-02-02
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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Vydáno: 2004-06-24
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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Vydáno: 2011-07-31
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BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock
Environmental testing. Test methods Body strength and impact shock
Vydáno: 1999-09-15
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