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BS EN IEC 60749-24:2026
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Vydáno: 2026-01-21
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BS EN IEC 60749-24:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Vydáno: 2026-02-02
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Draft BS EN IEC 60747-5-6/AMD1 ED2 Amendment 1 - Semiconductor devices
Draft BS EN IEC 60747-5-6/AMD1 ED2 Amendment 1 - Semiconductor devices
Vydáno: 2026-01-27
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25/30511332 DC
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Vydáno: 2025-08-26
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BS EN 60749-31:2003
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Vydáno: 2003-07-04
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Vydáno: 2019-09-02
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