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24/30499668 DC
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
Vydáno: 2024-08-30
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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Vydáno: 2024-09-13
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Vydáno: 2024-08-16
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BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Vydáno: 2021-07-07
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22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Vydáno: 2022-05-05
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BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Vydáno: 2017-04-30
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Vydáno: 2012-05-31
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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Vydáno: 2006-11-30
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