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BS IEC 62951-1:2017
Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
Vydáno: 2018-05-04
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22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Vydáno: 2022-05-05
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BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices Microwave integrated circuits. Limiters
Vydáno: 2023-05-25
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BS IEC 62830-7:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
Vydáno: 2023-07-07
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BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
Vydáno: 2026-03-10
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BS IEC 60747-5-13:2021+A1:2026
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Vydáno: 2026-02-06
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BS IEC 63601:2026
Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion
Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion
Vydáno: 2026-02-10
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24/30499668 DC
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
Vydáno: 2024-08-30
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BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Vydáno: 2024-09-13
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Vydáno: 2024-08-16
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