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sklademVydáno: 2009-01-28
IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV
Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test
Compatibilité électromagnétique (CEM) - Partie 4-17: Techniques d'essai et de mesure - Essai d'immunité à l'ondulation résiduelle sur entrée de puissance à courant continu
Formát
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Anglicky/Francouzsky Tisk
skladem
4862 Kč
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4862 Kč
| Označení normy: | IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV |
| Vydáno: | 2009-01-28 |
| Edice: | 1.2 |
| ICS: | 33.100.20 |
Popis
IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV
Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines
- test voltage waveform;
- range of test levels;
- test generator;
- test set-up;
- test procedure.
This consolidated version consists of the first edition (1999), its amendment 1 (2001) and its amendment 2 (2008). Therefore, no need to order amendments in addition to this publication.