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sklademVydáno: 2025-08-26
IEC TR 62433-4-1:2025
EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
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| Označení normy: | IEC TR 62433-4-1:2025 |
| Vydáno: | 2025-08-26 |
| Edice: | 1 |
| ICS: | 31.200 |
| Počet stran (Anglicky): | 40 |
| ISBN (Anglicky): | 9782832706633 |
Popis
IEC TR 62433-4-1:2025
IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB.
This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.