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Hlavní stránka>IEC TR 63571:2025 - Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
sklademVydáno: 2025-05-13

IEC TR 63571:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

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Označení normy:IEC TR 63571:2025
Vydáno:2025-05-13
Edice:1
ICS:31.080.99
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IEC TR 63571:2025

IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.