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>ISO 11775:2015-Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
sklademVydáno: 2015
ISO 11775:2015-Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants

ISO 11775:2015

ISO 11775:2015-Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants

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Označení normy:ISO 11775:2015
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Vydáno:2015
Jazyk:Anglicky
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ISO 11775:2015


ISO 11775:2015 describes five of the methods for the determination of normal spring constants for atomic force microscope cantilevers to an accuracy of 5 % to 10 %. Each method is in one of the three categories of dimensional, static experimental, and dynamic experimental methods. The method chosen depends on the purpose, convenience, and instrumentation available to the analyst. For accuracies better than 5 % to 10 %, more sophisticated methods not described here are required.