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>ISO 17470:2014-Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
sklademVydáno: 2014
ISO 17470:2014-Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

ISO 17470:2014

ISO 17470:2014-Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

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Označení normy:ISO 17470:2014
Počet stran:10
Vydání:2
Vydáno:2014
Jazyk:Anglicky
Popis

ISO 17470:2014


ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
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