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sklademVydáno: 2020
ISO 17867:2020-Particle size analysis — Small angle X-ray scattering (SAXS)

ISO 17867:2020

ISO 17867:2020-Particle size analysis — Small angle X-ray scattering (SAXS)

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Označení normy:ISO 17867:2020
Počet stran:27
Vydání:2
Vydáno:2020
Jazyk:Anglicky
Popis

ISO 17867:2020


This document specifies a method for the application of small-angle X-ray scattering (SAXS) to the estimation of mean particle sizes in the 1 nm to 100 nm size range. It is applicable in dilute dispersions where the interaction and scattering effects between the particles are negligible. This document describes several data evaluation methods: the Guinier approximation, model-based data fitting, Monte-Carlo?based data fitting, the indirect Fourier transform method and the expectation maximization method. The most appropriate evaluation method is intended to be selected by the analyst and stated clearly in the report. While the Guinier approximation only provides an estimate for the mean particle diameter, the other methods also give insight in the particle size distribution.