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Hlavní stránka>ISO 17901-2:2015-Optics and photonics — Holography-Part 2: Methods for measurement of hologram recording characteristics
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sklademVydáno: 2015
ISO 17901-2:2015-Optics and photonics — Holography-Part 2: Methods for measurement of hologram recording characteristics

ISO 17901-2:2015

ISO 17901-2:2015-Optics and photonics — Holography-Part 2: Methods for measurement of hologram recording characteristics

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Označení normy:ISO 17901-2:2015
Počet stran:20
Vydání:1
Vydáno:2015
Jazyk:Anglicky
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ISO 17901-2:2015


ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
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