Cena s DPH / bez DPH
>ISO/TS 21383:2021-Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
sklademVydáno: 2021
ISO/TS 21383:2021-Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements

ISO/TS 21383:2021

ISO/TS 21383:2021-Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements

Formát
Dostupnost
Cena a měna
Anglicky PDF
K okamžitému stažení
Tisknutelné
5950 Kč
Anglicky Tisk
Skladem
5950 Kč
Označení normy:ISO/TS 21383:2021
Počet stran:59
Vydání:1
Vydáno:2021
Jazyk:Anglicky
Popis

ISO/TS 21383:2021


This document describes methods to qualify the scanning electron microscope with the digital imaging system for quantitative and qualitative SEM measurements by evaluating essential scanning electron microscope performance parameters to maintain the performance after installation of the instruments. The items and evaluating methods of the performance parameters are selected by users for their own purposes.