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Hlavní stránka>PD IEC/TS 62622:2012 Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings
sklademVydáno: 2013-02-28
PD IEC/TS 62622:2012 Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings

PD IEC/TS 62622:2012

Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings

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7482 Kč
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7482 Kč
Označení normy:PD IEC/TS 62622:2012
Počet stran:44
Vydáno:2013-02-28
ISBN:978 0 580 80384 0
Status:Standard
Počet stran (Anglicky):44
ISBN (Anglicky):978 0 580 80384 0
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PD IEC/TS 62622:2012


This standard PD IEC/TS 62622:2012 Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings is classified in these ICS categories:
  • 07.030 Physics. Chemistry
  • 07.120 Nanotechnologies

This technical specification specifies the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating features, and provides guidance on the categorization of measurement and evaluation methods for their determination.

This specification is intended to facilitate communication among manufacturers, users and calibration laboratories dealing with the characterization of the dimensional quality parameters of artificial gratings used in nanotechnology.

This specification supports quality assurance in the production and use of artificial gratings in different areas of application in nanotechnology. Whilst the definitions and described methods are universal to a large variety of different gratings, the focus is on one-dimensional (1D) and two-dimensional (2D) gratings.