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sklademVydáno: 2018-06-08
18/30319114 DC
BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
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| Označení normy: | 18/30319114 DC |
| Počet stran: | 46 |
| Vydáno: | 2018-06-08 |
| Status: | Draft for Comment |
Popis
18/30319114 DC
This standard 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM) is classified in these ICS categories:
- 35.240.70 IT applications in science
- 37.020 Optical equipment