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Hlavní stránka>20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer
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sklademVydáno: 2020-10-23
20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer

20/30425836 DC

BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer

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580 Kč
Označení normy:20/30425836 DC
Počet stran:24
Vydáno:2020-10-23
Status:Draft for Comment
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20/30425836 DC


This standard 20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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