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Hlavní stránka>21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
sklademVydáno: 2021-04-01
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

21/30394409 DC

BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

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Označení normy:21/30394409 DC
Počet stran:18
Vydáno:2021-04-01
Status:Draft for Comment
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21/30394409 DC


This standard 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method is classified in these ICS categories:
  • 25.220.40 Metallic coatings
  • 17.040.20 Properties of surfaces

This document specifies a destructive method for the measurement of the local thickness of metallic coatings (hereafter also other inorganic coatings are meant) by examination of cross-sections with a scanning electron microscope (SEM). The method can be used for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (ISO 1463) when applicable. The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).