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sklademVydáno: 2024-02-05
24/30479444 DC
BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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| Označení normy: | 24/30479444 DC |
| Počet stran: | 56 |
| Vydáno: | 2024-02-05 |
| Status: | Draft for Comment |
Popis
24/30479444 DC
This standard 24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
- 37.020 Optical equipment
- 71.040.50 Physicochemical methods of analysis