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sklademVydáno: 2026-07-17
26/30564451 DC
BS EN IEC 63740 Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs (Fast Track)
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| Označení normy: | 26/30564451 DC |
| Počet stran: | 29 |
| Vydáno: | 2026-07-17 |
| Status: | Draft for Comment |
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26/30564451 DC
This standard 26/30564451 DC BS EN IEC 63740 Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs (Fast Track) is classified in these ICS categories:
- 71.060 Inorganic chemicals
- 71.060.20 Oxides