Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDANovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
sklademVydáno: 2017-11-28
BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
4500 Kč
Anglicky Tisk
Skladem
4500 Kč
Označení normy:BS EN 60749-4:2017
Počet stran:16
Vydáno:2017-11-28
ISBN:978 0 580 94229 7
Status:Standard
Popis

BS EN 60749-4:2017


This standard BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.


Tisk