>BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
sklademVydáno: 2006-09-29
BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Formát
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4648 Kč
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Skladem
4648 Kč
Označení normy:
BS EN 62373:2006
Počet stran:
16
Vydáno:
2006-09-29
ISBN:
0 580 49255 9
Status:
Standard
Popis
BS EN 62373:2006
This standard BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) is classified in these ICS categories:
31.080.30 Transistors
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
