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Hlavní stránka>BS EN ISO 25178-73:2019 Geometrical product specifications (GPS). Surface texture: Areal Terms and definitions for surface defects on material measures
sklademVydáno: 2019-06-18
BS EN ISO 25178-73:2019 Geometrical product specifications (GPS). Surface texture: Areal Terms and definitions for surface defects on material measures

BS EN ISO 25178-73:2019

Geometrical product specifications (GPS). Surface texture: Areal Terms and definitions for surface defects on material measures

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Označení normy:BS EN ISO 25178-73:2019
Počet stran:18
Vydáno:2019-06-18
ISBN:978 0 580 98586 7
Status:Standard
Popis

BS EN ISO 25178-73:2019


This standard BS EN ISO 25178-73:2019 Geometrical product specifications (GPS). Surface texture: Areal is classified in these ICS categories:
  • 01.040.17 Metrology and measurement. Physical phenomena (Vocabularies)
  • 17.040.40 Geometrical Product Specification (GPS)

This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects.

This document is applicable as follows:

  1. to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers;

  2. to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements;

    NOTE

    Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example.

  3. to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration;

  4. to educate users of material measures about the different significance and importance of different kinds of defect;

  5. for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.