PRICES include / exclude VAT
31.080.01 Polovodičové součástky obecně
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Vydáno: 2019-11-22
Anglicky Secure PDF
Immediate download
310.59 €
Anglicky Hardcopy
In stock
310.59 €
BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Vydáno: 2000-06-15
Anglicky Secure PDF
Immediate download
368.38 €
Anglicky Hardcopy
In stock
368.38 €
PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Vydáno: 2001-06-15
Anglicky Secure PDF
Immediate download
161.32 €
Anglicky Hardcopy
In stock
161.32 €
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Vydáno: 2011-06-30
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Vydáno: 2018-04-30
Anglicky Secure PDF
Immediate download
368.38 €
Anglicky Hardcopy
In stock
368.38 €
Anglicky Secure PDF
Immediate download
161.32 €
Anglicky Hardcopy
In stock
161.32 €
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Vydáno: 2020-10-01
Anglicky Secure PDF
Immediate download
190.21 €
Anglicky Hardcopy
In stock
190.21 €
Anglicky Secure PDF
Immediate download
368.38 €
Anglicky Hardcopy
In stock
368.38 €