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BS EN IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Vydáno: 2025-08-18
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Vydáno: 2024-02-06
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BS EN IEC 60749-21:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
Vydáno: 2026-02-12
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BS EN IEC 60749-23:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Vydáno: 2026-02-12
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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Vydáno: 2019-11-22
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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Vydáno: 2020-10-01
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