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Main page>BSI Standards>31 ELEKTRONIKA>31.080 Polovodičové součástky>31.080.01 Polovodičové součástky obecně

31.080.01 Polovodičové součástky obecně

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194 results
First page124678...151617Last page
25/30509887 DC
Draft BS EN 63492-1 Semiconductor devices - Isolation for semiconductor devices Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices
Vydáno: 2025-02-06
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25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Vydáno: 2025-03-25
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25/30510419 DC
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Vydáno: 2025-11-13
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BS EN IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Vydáno: 2025-08-18
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BS EN IEC 60749-23:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Vydáno: 2026-02-12
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BS EN IEC 60749-21:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Solderability
Vydáno: 2026-02-12
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26/30510433 DC
Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile
Vydáno: 2026-01-09
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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Vydáno: 2019-11-22
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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Vydáno: 2010-06-30
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BS EN 60191-6-6:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine pitch land grid array (FLGA)
Vydáno: 2001-09-05
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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Vydáno: 2021-02-03
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BS EN IEC 60749-28:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Vydáno: 2022-12-22
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194 results
First page124678...151617Last page