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Homepage>BSI Standards>31 ELEKTRONIKA>31.080 Polovodičové součástky>31.080.01 Polovodičové součástky obecně

31.080.01 Polovodičové součástky obecně

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170 results
First page1245678...131415Last page
BS IEC 63068-3:2020
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence
Vydáno: 2020-07-24
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Vydáno: 2020-01-14
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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Vydáno: 2020-09-30
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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Vydáno: 2021-04-26
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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Vydáno: 2020-02-24
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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
Vydáno: 2020-01-14
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BS EN 60191-6-1:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for gull-wing lead terminals
Vydáno: 2002-03-29
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BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
Vydáno: 2018-05-30
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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Vydáno: 2020-07-21
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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Vydáno: 2011-09-30
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BS EN 60749-21:2011
Semiconductor devices. Mechanical and climatic test methods Solderability
Vydáno: 2011-08-31
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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Vydáno: 2010-01-31
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170 results
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