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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Vydáno: 2012-05-31
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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Vydáno: 2006-11-30
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BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Vydáno: 2018-03-16
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BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Vydáno: 2017-04-30
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BS EN 62258-1:2010
Semiconductor die products Procurement and use
Semiconductor die products Procurement and use
Vydáno: 2010-11-30
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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Vydáno: 2019-03-05
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BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications
LED modules for general lighting. Safety specifications
Vydáno: 2022-03-31
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BS EN IEC 63373:2022
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Vydáno: 2022-06-17
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Vydáno: 2019-04-24
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