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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Vydáno: 2010-02-28
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Vydáno: 2015-10-31
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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
Vydáno: 1983-01-31
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BS EN 61207-7:2013
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Vydáno: 2015-07-31
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BS 6337-4:1984
General methods of chemical analysis Method for determination of chloride ions by potentiometry
General methods of chemical analysis Method for determination of chloride ions by potentiometry
Vydáno: 1984-01-31
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BS EN ISO 16664:2017
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Vydáno: 2017-08-11
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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Vydáno: 2019-05-31
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Vydáno: 2010-11-30
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PD ISO/TR 15969:2021 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-06-21
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Vydáno: 2021-03-26
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