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Hlavní stránka>IEC 60747-14-12:2026 - Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
sklademVydáno: 2026-11-04
IEC 60747-14-12:2026 - Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

IEC 60747-14-12:2026

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

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Označení normy:IEC 60747-14-12:2026
Vydáno:2026-11-04
Edice:1
ICS:31.080.01
Počet stran (Anglicky):19
ISBN (Anglicky):9782832715871
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IEC 60747-14-12:2026

IEC 60747-14-12:2026 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

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