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sklademVydáno: 2011-10-24
IEC 61788-15:2011
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
Měna
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| Označení normy: | IEC 61788-15:2011 |
| Vydáno: | 2011-10-24 |
| Edice: | 1 |
| ICS: | 17.220.20 |
Popis
IEC 61788-15:2011
IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.