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>ISO 16526-3:2011 - Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 3: Spectrometric method
sklademVydáno: 2011-12-15
ISO 16526-3:2011 - Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 3: Spectrometric method

ISO 16526-3:2011

ISO 16526-3:2011 - Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 3: Spectrometric method

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Anglicky PDF
K okamžitému stažení
Tisknutelné
1258 Kč
Francouzsky PDF
K okamžitému stažení
Tisknutelné
1258 Kč
Anglicky Tisk
Skladem
1258 Kč
Francouzsky Tisk
Skladem
1258 Kč
Označení normy:ISO 16526-3:2011
Vydání:1
Vydáno:2011-12-15
Počet stran (Anglicky):6
Počet stran (Francouzsky):6
Popis

ISO 16526-3:2011

ISO 16526-3:2011 specifies the test method for a non-invasive measurement of X-ray tube voltages using the energy spectrum of X-rays (spectrometric method). It covers the voltage range from 10 kV to 500 kV.

The intention is to check the correspondence of the actual voltage with the indicated value on the control panel of the X-ray unit. It is intended to measure the maximum energy only and not the complete X-ray spectrum.

The procedure is applicable for tank type and constant potential X-ray units.