Cena s DPH / bez DPH
sklademVydáno: 2020-08-24
ISO 22278:2020
ISO 22278:2020 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
Formát
Dostupnost
Cena a měna
Anglicky PDF
K okamžitému stažení
Tisknutelné
4547 Kč
Anglicky Tisk
skladem
4547 Kč
| Označení normy: | ISO 22278:2020 |
| Vydání: | 1 |
| Vydáno: | 2020-08-24 |
| Počet stran (Anglicky): | 29 |
Popis
ISO 22278:2020
This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.