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>ISO 23833:2013 - Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
sklademVydáno: 2013-04-05
ISO 23833:2013 - Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

ISO 23833:2013

ISO 23833:2013 - Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

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Anglicky PDF
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1258 Kč
Francouzsky PDF
K okamžitému stažení
Tisknutelné
1258 Kč
Anglicky Tisk
Skladem
1258 Kč
Francouzsky Tisk
Skladem
1258 Kč
Označení normy:ISO 23833:2013
Vydání:2
Vydáno:2013-04-05
Počet stran (Anglicky):27
Počet stran (Francouzsky):26
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ISO 23833:2013

ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.