Cena s DPH / bez DPH
sklademVydáno: 2022-07-13
ISO 23729:2022
ISO 23729:2022 - Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Formát
Dostupnost
Cena a měna
Anglicky PDF
K okamžitému stažení
Tisknutelné
2860 Kč
Anglicky Tisk
skladem
2860 Kč
| Označení normy: | ISO 23729:2022 |
| Vydání: | 1 |
| Vydáno: | 2022-07-13 |
| Počet stran (Anglicky): | 15 |
Popis
ISO 23729:2022
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
