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Hlavní stránka>UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)
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sklademVydáno: 2014-07-01
UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)

UNE EN 60749-26:2014

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 26: Ensayo de la sensibilidad a la descarga electrostática (ESD). Modelo del cuerpo humano (HBM) (Ratificada por AENOR en julio de 2014.)

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2 204 Kč
Označení normy:UNE EN 60749-26:2014
Počet stran:44
Vydáno:2014-07-01
Popis

This standard UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.) is classified in these ICS categories:

  • 31.080.01
:
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